Providing Testing Services for Customers Since 1976

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 Featured Capabilities
High Performance Liquid Chromatography
HPLC / GPC at 150°C
High Temperature Testing
3,000° F – Static and Fatigue Testing with Hydraulic Grips
Scanning Electron Microscopy With EDX Analyzer
Contamination Analysis, Chemical analysis on microscopic particles, Surface analysis, Failure analysis
Thermal Bench System
DSC, TMA, TGA, DMA for Thermal Analysis
Thermal Outgassing
For determination of TML, CVCM & WVR
Thermal Oxidative Stability
Per G.E. Aircraft Engines
X-Ray Fluorescence
Plating thickness measurements, Chemical composition analysis
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 Highly Accelerated Life Testing (HALT) is a design verification tool for testing electronic and electromechanical devices. HALT employs extreme thermal rate changes and vibration stresses that quickly uncover design flaws and precipitates latent defects that might otherwise be exhibited as field failures and warranty problems.

HASS Testing applies all stresses simultaneously. During vibration, continuously ramp temperature between brief dwells at extremes. HASS Stress levels are based on HALT limits: Include any "critical" additional product stresses (as determined from HALT, e.g. product power), conduct precipitation screen and evaluate product beyond operating limits, near destruct limits, precipitate failures in product due to "latent" defects, conduct detection screen and evaluate product near operating limits, and confirm and explore precipitation screen failures, and other hard and soft failures.
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